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SN74BCT8244ADW

Manufacturer	Texas Instruments Incorporated
Description	Scan Buffer/Line Driver 8-CH Non-Inverting 3-ST BiCMOS 24-Pin SOIC Tube IC SCAN TEST DEVICE BUFF 24-SOIC Specialty Function Logic Device w/Octal Buffers LOGIC, SCAN TEST DEVICE BUFF, 24SOIC IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers BCT, 8-Bit 三态非反相缓冲器，线路驱动器, 24针 SOIC封装
Category	Integrated CircuitsLogic ICsScan Test Logic ICs

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Product Category	Specialty Function Logic	Standard Package	Rail / Tube
Factory Pack Quantity	25	Standard Package Name	SOIC

Voltage	5	Logic Type	BCT
Output Type	3-State	Input Signal	Single-Ended
Number of Bits	8	Voltage Rating	4.5
Number of Inputs	8	Voltage - Supply	4.5 V ~ 5.5 V
Number of Outputs	8	Number of Channels	8
Number of Elements	2	Current Rating (Max)	Catalog
Frequency - Output 1	70	Voltage - Supply (Min)	4.5 V
Propagation Delay (Max)	29	Current - Quiescent (Iq)	35000 uA
Delay Time - Propagation	29 ns	Current - Quiescent (Max)	52
Current - Output High, Low	-15 mA	Current - Output Source/Sink	64/-15
Max Propagation Delay @ V, Max CL	7@5V ns	Propagation Delay tpLH / tpHL (Max)	8.5
Common Mode Transient Immunity (Min)	Commercial

Temperature - Test

0 to 70

Operating Temperature

0°C ~ 70°C

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